O-PTIR: non-contact, submicron, visible probe photothermal infrared spectroscopy
The use of O-PTIR submicron visible probe, with no contact, to detect the photothermal IR effect is the key breakthrough. It enables non-contact, submicron IR spectroscopy in reflection mode. This provides new analytical capabilities to analyze polymers, live single cells, particulates and more.
Problem solved.
O-PTIR submicron visible probe, non-contact, detection of the photothermal IR effect overcomes the key limitation of traditional FTIR/QCL microscopy. It does this by removing the fundamental spatial resolution limits of IR spectroscopy (10-20 microns). This limit is now governed by the visible beam wavelength (.5 micron). O-PTIR achieves submicron spatial resolution in a non-contact, reflection mode, operation.
John Jay College of
Criminal Justice (CUNY)
Pioneer in FTIR microspectroscopy
Spectra on thick samples that correlate to transmission FTIR
Provides the best of both worlds by combining the convenience of O-PTIR submicron visible probe in non-contact reflection mode technique with “FTIR transmission-like” quality. The spectra are collected in reflection mode, where thickness, surface roughness or particle shape/size are not issues.
Three different O-PTIR spectra collected from 20 µm thick samples were searched against the KnowItAll® database. The results were high matches for polystyrene (PS) (left), polyethylene terephthalate (PS) (middle) and polymethyl methacrylate (PE) (right).
mIRage combines O-PTIR and Raman
to improve results
The world’s first simultaneous IR+Raman microscopy system is a unique dual modality platform that combines all the advantages of O-PTIR with complementary Raman microscopy via simultaneous detection of the visible probe laser.
Photothermal Spectroscopy Corp
325 Chapala Street
Santa Barbara, CA 93101
Phone: (805) 845-6568
Email: info [at] photothermal.ndic.com